Complementary scanning electron microscope (SEM) shale images for improved super-resolution network


Hitachi SU8010 Field-Emission Scanning Electron Microscope (Jiyang) Origin Data

The FE-SEM was used to capture grayscale images of the shale samples, with images taken from five different areas of each sample at magnifications of 1X, 2X, 4X, 8X, and 16X, corresponding to voxel lengths of 12.4 nm, 24.8 nm, 49.6 nm, 99.2 nm, and 198.4 nm, respectively.

Segmented
No
Voxel length (x, y, z)
1280.0, 960.0, None
Sample
View Sample: Shale (Jiyang)

Data

JY5_16x.tif
1.2 MB

Image Type None
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Number of Slices None
Byte Order None

JY5_1x.tif
1.2 MB

Image Type None
Width None
Height None
Number of Slices None
Byte Order None

JY5_2x.tif
1.2 MB

Image Type None
Width None
Height None
Number of Slices None
Byte Order None

JY5_4x.tif
1.2 MB

Image Type None
Width None
Height None
Number of Slices None
Byte Order None

JY5_8x.tif
1.2 MB

Image Type None
Width None
Height None
Number of Slices None
Byte Order None